TDR based end-to-end compliance testing for high-speed data lines as PCIe Gen. 4
High speed test adapters for high speed backplane interfaces (open VPX, CPCI Serial) and not assembled ball grid arrays
Our new SOSA aligned 7 slot VPX backplane p.n. B143070010 successfully passed a measurement of the high speed links and testing against the 100GBASE-KR4 performance. The measurement was conducted by the independent external test laboratory Harting Corporate Technology Services which is certified according to DIN EN ISO/IEC 17025: 2005.
Environmental Type Test
Testing according to military and industry standards
Environmental Stress Screening Tests (ESS – Test)
Switch-on behavior by extended temperature ranges
High and Low Temperature measurement with moisture measurement environment
High Voltage Tests
Altitude: MIL-STD-810F
Transportation Vibration: MIL-STD-810E
Funktional Shock: MIL-STD-810G
Other tests or standards on request
EMI-Tests
3D AOI
Automatic optical inspection
2D and 3D images taken and processed automatically
1x 15 MP top camera
4x 10MP side cameras
X-Ray
By making use of computed tomography utilizing x-rays, a non-destructive and detailed examination of the inner structure of PCBs is possible
