TDR based end-to-end compliance testing for high-speed data lines as PCIe Gen. 4
High speed test adapters for high speed backplane interfaces (open VPX, CPCI Serial) and not assembled ball grid arrays
Our new SOSA aligned 7 slot VPX backplane p.n. B143070010 successfully passed a measurement of the high speed links and testing against the 100GBASE-KR4 performance. The measurement was conducted by the independent external test laboratory Harting Corporate Technology Services which is certified according to DIN EN ISO/IEC 17025: 2005.
Environmental Type Test
Testing according to military and industry standards
Environmental Stress Screening Tests (ESS – Test)
Switch-on behavior by extended temperature ranges
High and Low Temperature measurement with moisture measurement environment
High Voltage Tests
Transportation Vibration: MIL-STD-810E
Funktional Shock: MIL-STD-810G
Other tests or standards on request
Automatic optical inspection
2D and 3D images taken and processed automatically
1x 15 MP top camera
4x 10MP side cameras
By making use of computed tomography utilizing x-rays, a non-destructive and detailed examination of the inner structure of PCBs is possible
Necessary cookies are absolutely essential for the website to function properly. This category only includes cookies that ensures basic functionalities and security features of the website. These cookies do not store any personal information.
Any cookies that may not be particularly necessary for the website to function and is used specifically to collect user personal data via analytics, ads, other embedded contents are termed as non-necessary cookies. It is mandatory to procure user consent prior to running these cookies on your website.